The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Jan. 02, 2025
Applicant:

Stress Engineering Services, Inc., Mason, OH (US);

Inventors:

Clinton A. Haynes, Mason, OH (US);

Shannon R. Read, Lebanon, OH (US);

Michael William Landgraf, Loveland, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/007 (2013.01);
Abstract

A rotational test apparatus includes a support assembly, a plurality of bolts, an obstacle, and a drum. The drum is rotatably supported by the support assembly and includes a first end wall, a second end wall, and a side wall which cooperate to define an interior compartment. The first end wall defines a passageway which extends into the interior compartment and is sized to facilitate selective insertion and removal of packages therethrough. The side wall defines a plurality of threaded apertures including a first plurality which is occupied by said bolts and a second plurality which is unoccupied. The second plurality exceeds the first plurality by at least a ratio of 10 to 1. The obstacle is secured to the side wall within the interior compartment by at least some of said bolts threaded into respective ones of the first plurality of the threaded apertures. Methods are also provided.


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