The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Mar. 10, 2023
Applicant:

Northwestern Polytechnical University, Shaanxi, CN;

Inventors:

Limin Gao, Shaanxi, CN;

Ning Ge, Shaanxi, CN;

Lei Wang, Shaanxi, CN;

Bo Ouyang, Shaanxi, CN;

Xiangfu Lei, Shaanxi, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01L 1/24 (2013.01);
Abstract

The disclosure discloses a global pressure acquisition system for a rotating model, including a CCD camera, a signal generator, a stroboscopic pulse LED light source, a photoelectric sensor, a preset counter, and a controller. The disclosure further discloses a global pressure acquisition method for a rotating model. The disclosure has the beneficial effects that, by using the non-contact measuring method disclosed by the present disclosure, a measured model and a flow field are not damaged, a submillimeter-level spatial resolution is achieved, it is ensured that the acquired PSP image of the rotating model is clear, and the signal to noise ratio of the image is increased.


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