The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Oct. 04, 2023
Applicant:

Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);

Inventor:

Joseph Slater, Dexter, MI (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4406 (2013.01); G01J 2003/4424 (2013.01);
Abstract

A reference material for and a method of calibrating at least one Raman spectrometer are disclosed. The reference material includes quantum dots distributed in a transparent condensed phase material such that light emitted by the reference material in response to receiving excitation light having an excitation wavelength provided by the Raman spectrometer(s) has a predetermined spectral intensity distribution in a spectral measurement range of the Raman spectrometer(s). The method includes designing, manufacturing and providing the reference material, determining an emission spectrum of the reference material, and calibrating each Raman spectrometer by determining a reference spectrum of the reference material and by adjusting a determination of spectral intensity values of intensity spectra performed by the Raman spectrometer based on the reference spectrum and the emission spectrum of the reference material.


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