The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Feb. 01, 2021
Applicant:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Inventors:
Craig Prater, Santa Barbara, CA (US);
Derek Decker, Carmel, CA (US);
David Grigg, Santa Barbara, CA (US);
Assignee:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01J 3/02 (2006.01); G01J 3/10 (2006.01); G01J 3/28 (2006.01); G01J 3/447 (2006.01); G01J 3/453 (2006.01);
U.S. Cl.
CPC ...
G01J 3/108 (2013.01); G01J 3/0208 (2013.01); G01J 3/0224 (2013.01); G01J 3/2823 (2013.01); G01J 3/447 (2013.01); G01J 3/453 (2013.01);
Abstract
A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.