The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Sep. 09, 2020
Nec Corporation, Tokyo, JP;
Akira Tsuji, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection system includes: shape data acquisition means for acquiring shape data of a surface of a structure; reference shape calculation means for calculating a reference shape for the shape data acquired by the shape data acquisition means; abnormality candidate extraction means for extracting an abnormality candidate area of the surface based on a difference between the reference shape calculated by the reference shape calculation means and the shape data corresponding to the reference shape; degree of roughness calculation means for calculating a degree of roughness of the abnormality candidate area extracted by the abnormality candidate extraction means and an area near the extracted abnormality candidate area; and abnormality determination means for determining that there is an abnormality in an area where the degree of roughness calculated by the roughness calculation means exceeds a threshold among the abnormality candidate areas extracted by the abnormality candidate extraction means.