The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Sep. 25, 2020
Applicant:
Ultimaker B.v., Utrecht, NL;
Inventor:
Rijk Van Manen, Utrecht, NL;
Assignee:
Ultimaker B.V., Zaltbommel, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B29C 64/118 (2017.01); B29C 64/209 (2017.01); B29C 64/236 (2017.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/118 (2017.08); B29C 64/209 (2017.08); B29C 64/236 (2017.08); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01B 11/02 (2013.01);
Abstract
A method of determining one or more printer properties of an FFF printer, comprising the steps of: a) depositing a pattern () of one or more lines on a support () using the FFF printer; b) making an image of the deposited pattern () on the support () using an imaging device; c) analysing one or more geometric features of the pattern () in the image; and d) determining the one or more printer properties of the FFF printer based the one or more geometric features.
Van Manen, Rijk. (2025). Method and system for determining dynamic properties in x and y print directions of an fff printer using center line and line width variation analysis (U.S. Patent No. 12370747). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12370747
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile