The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Feb. 02, 2024
Applicant:

Dental Monitoring, Paris, FR;

Inventors:

Philippe Salah, Paris, FR;

Thomas Pellissard, Clichy, FR;

Laurent Debraux, Paris, FR;

Assignee:

DENTAL MONITORING, Paris, FR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61C 9/00 (2006.01); G06F 18/22 (2023.01); G06T 7/00 (2017.01); G06T 7/33 (2017.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G16H 50/50 (2018.01); G16H 50/70 (2018.01);
U.S. Cl.
CPC ...
A61C 9/0053 (2013.01); G06F 18/22 (2023.01); G06T 7/0016 (2013.01); G06T 7/337 (2017.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G16H 50/50 (2018.01); G16H 50/70 (2018.01); G06T 2207/20084 (2013.01); G06T 2207/30036 (2013.01); G06V 2201/03 (2022.01);
Abstract

Method of enrichment of a reference model to be enriched representing a dental arch. Acquisition, under first real conditions, of a current image of the arch displaying one region. Exploration of the reference model in such a manner as to determine a first view of the reference model, in a first direction of observation the reference image exhibiting a maximum match with the current image. Determination, by comparison of the images, of a first orphan point represented on the current image and not represented on the reference image when the current image is in a first register position in which it is superposed, in the space of the reference model, with the reference image. Addition, in the reference model, of a point on a first straight line parallel to the first direction of observation and passing through the first orphan point in the first register position.


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