The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
May. 28, 2020
Essilor International, Charenton-le-pont, FR;
Adéle Longo, Charenton-le-pont, FR;
Gildas Marin, Charenton-le-pont, FR;
Martha Hernandez-Castaneda, Charenton-le-pont, FR;
Essilor International, Charenton-le-Pont, FR;
Abstract
The invention concerns a couple of test images, for a binocular refraction method, that comprises: —a first test image () to be provided to a first eye of a subject, comprising a central image (c) surrounded by a first peripheral image (p), this central image comprising at least one optotype (o); and—a second test image () to be provided to a second eye of the subject, comprising a central image (c) surrounded by a second peripheral image (p) substantially identical to the first peripheral image, this central image being deprived of optotypes, or comprising only optotypes (o) with a low contrast or sharpness level. The invention concerns also an associated binocular refraction method and refraction instrument, and an associated computer program.