The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jul. 10, 2014
Applicant:
University of Houston System, Houston, TX (US);
Inventors:
Jaroslaw Wosik, Houston, TX (US);
Jerzy Krupka, Izabelin, PL;
Venkat Selvamanickam, Houston, TX (US);
Assignee:
UNIVERSITY OF HOUSTON SYSTEM, Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 39/24 (2006.01); H10N 60/01 (2023.01);
U.S. Cl.
CPC ...
H10N 60/01 (2023.02);
Abstract
A method and apparatus for quality control of superconducting tapes, comprising non-destructive and non-contact methods for measuring the surface resistance of a superconducting tape during tape growth. The dielectric resonator techniques of the present invention can be adapted for measurements at the elevated temperatures used during annealing as well as at room and lower temperatures, providing the opportunity for real-time quality control of semiconductor tapes as they are being fabricated.