The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Aug. 15, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Daiki Ishihara, Yokohama Kanagawa, JP;

Fukutomo Nakanishi, Sumida Tokyo, JP;

Satoshi Aoki, Kawasaki Kanagawa, JP;

Hiroyoshi Haruki, Kawasaki Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); G06K 9/00 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1466 (2013.01); H04L 63/1416 (2013.01);
Abstract

A detection systemincludes a control deviceand a monitoring devicecommunicably connected to the control device. An acquisition unitA of the control deviceacquires a target's observation value by a sensor. A first-noise-output unitB outputs a first-noise-value changing with time and less than a resolution of the sensor. An integration unitC outputs an integrated value obtained by integrating the first-noise-value and the observation value. A transmission unitD transmits the integrated value to the monitoring device. A separation unitA of the monitoring deviceseparates the integrated value from the control deviceinto the observation value and the first-noise-value. A second-noise-output unitB outputs a second-noise-value as the first-noise-value. A detection unitC detects whether the integrated value is a replay attack using the spatial distance between the first-noise-value and the second-noise-value.


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