The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Oct. 10, 2023
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Oliver Lang, Linz, AT;

Matthias Wagner, Engerwitzdorf, AT;

Esmaeil Kavousi Ghafi, Linz, AT;

Andreas Schwarz, Öpping, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/13 (2015.01); H04B 17/14 (2015.01); H04B 17/20 (2015.01);
U.S. Cl.
CPC ...
H04B 17/13 (2015.01); H04B 17/14 (2015.01); H04B 17/201 (2023.05);
Abstract

A method for determining a nonlinearity characteristic of a receiver path includes generating a set of N×M digital samples by repeating N times selecting an scaling factor from a set of N scaling factors, generating a version of a test signal, the version of the test signal corresponding to a test signal scaled by the respective scaling factor, processing the respective version of the test signal in at least a part of the receiver path to generate a respective processed signal, and storing M digital samples corresponding to the respective processed signal. Fourier-transformed data are generated using at least a portion of the set of N×M digital samples and a nonlinearity characteristic of the receiver path is determined based on the Fourier-transformed data.


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