The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Dec. 30, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Martin Cochet, South Salem, NY (US);

John Francis Bulzacchelli, Somers, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1014 (2013.01);
Abstract

A system and method for compensating segmented DAC intrinsic INL by adjusting the relative strength of DAC thermometer segments. In the method, the strength of each thermometer segment is adjusted sequentially to reduce INL to 0 at one point on each thermometer code range. The strength of the binary section is also adjusted to further reduce INL while conserving output amplitude. The system includes a calibration circuit that senses the DAC differential output and compares it to an ideal output generated from the same DAC via dithering between 0 and a maximum code. The compensation scheme only performs a specific type of DAC compensation, specifically compensating for systematic non-linearity rather than for mismatch-induced non-linearity. The method can also be applied to calibrate a full thermometer DAC.


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