The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Nov. 01, 2022
Applicant:

Bruker Daltonics Gmbh & Co. KG, Bremen, DE;

Inventors:

Andreas Haase, Bremen, DE;

Marcel Niehaus, Bremen, DE;

Jens Höhndorf, Bremen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
H01J 49/0418 (2013.01); G06T 7/70 (2017.01);
Abstract

The invention relates to devices and methods for desorption scanning of analyte material deposited on a sample support, which can comprise the following mode of operation: (a) setting a position of the support to approach an impingement region onto which a beam is directed for local desorption of analyte material; (b) determining an actual position of the support after setting the position; (c) comparing the determined actual position with a target position of the support to determine any deviation; (d) adjusting a beam orientation, if a deviation is detected, so that the beam is directed onto the impingement region on the support that results when there is no deviation; (e) applying the beam to the impingement region to locally desorb analyte material and deliver it to an analyzer; and (f) checking whether a predetermined end condition is satisfied and, if not, repeating steps (a)-(e) for a subsequent non-congruent impingement region.


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