The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Nov. 03, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Keita Nagai, Tokyo, JP;

Kazuomi Toguchi, Kanagawa, JP;

Honami Watanabe, Tochigi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); A61B 5/00 (2006.01); G06T 7/00 (2017.01); G16H 50/50 (2018.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); A61B 5/0077 (2013.01); A61B 5/7267 (2013.01); G06T 7/0016 (2013.01); G16H 50/50 (2018.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06V 2201/03 (2022.01);
Abstract

A learning system which is capable of easily collecting data of affected parts having completely recovered, as training data. When it is determined that an affected part has completely recovered based on affected-part image data generated by shooting the affected part, image data accompanied with the same affected part ID as that of the affected-part image data is identified from among image data set stored in a storage device of the learning system. The actual number of days to a complete recovery of the affected part is calculated from shooting dates of the identified image data and the affected-part image data, and is added to the affected-part image data. The affected-part image data accompanied with the actual number of days to the complete recovery is used as training data to create a trained model that predicts the number of days to a complete recovery of the affected part.


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Nagai, Keita. (2025). Learning system for creating trained model that predicts complete recovery period of affected part, control method for same, and storage medium (U.S. Patent No. 12367660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12367660

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