The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jul. 02, 2022
Applicant:
Carl Zeiss Meditec Ag, Jena, DE;
Inventors:
Dominik Litsch, Schorndorf, DE;
Stefan Saur, Aalen, DE;
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); A61B 90/20 (2016.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); A61B 90/20 (2016.02); G01B 11/002 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30244 (2013.01);
Abstract
A system and a method for optically detecting a pose of at least one instrument in an operating theater are provided. The method includes determining pose information of the at least one instrument with an optical pose detection device of a surgical microscope or with a microscope-external optical pose detection device, determining whether the pose information is biunique or whether a biunique determination of the pose of the instrument is possible, and evaluating additional information for determining additional pose information, at least for a case where no biunique determination of the pose is possible.