The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Oct. 11, 2022
International Business Machines Corporation, Armonk, NY (US);
Haoxiang Qiu, Tokyo, JP;
Tadanobu Inoue, Yokohama, JP;
Takayuki Katsuki, Tokyo, JP;
Ryuki Tachibana, Tokyo, JP;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
One or more systems, devices, computer program products, and/or computer-implemented methods provided herein relate to accurate anomaly detection in images using patched features. According to an embodiment, an extraction component can extract multiple layers of features from one or more patches of an image using a pretrained convolutional neural network (CNN). A feature mapping component can concatenate the features from the multiple layers to generate a tensor feature map comprising a one-dimensional feature vector for respective patches. A cropping component can perform center cropping on the tensor feature map. A calculation component can calculate a distance to a feature distribution mean for respective patches.