The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Apr. 28, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Jun Liao, Shenzhen, CN;

Jianhua Yao, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 7/62 (2017.01); H04N 23/80 (2023.01); H04N 23/951 (2023.01); H04N 23/955 (2023.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 7/62 (2017.01); H04N 23/80 (2023.01); H04N 23/951 (2023.01); H04N 23/955 (2023.01); G06T 2207/10056 (2013.01);
Abstract

A computer device obtains a confocal microscopy image. The device determines a pinhole diameter of a first detector pinhole of a confocal microscope that is used to acquire the image. The pinhole diameter has an influence on a parameter of the image. The device obtains a target image processing model corresponding to the pinhole diameter of the first detector pinhole. The target image processing model is configured to improve the parameter of the image. The device causes the target image processing model to process the image to obtain a target image having the improved parameter.


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