The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Apr. 06, 2021
University of Tsukuba, Ibaraki, JP;
Yoshiaki Yasuno, Tsukuba, JP;
Thitiya Seesan, Tsukuba, JP;
UNIVERSITY OF TSUKUBA, Tsukuba, JP;
Abstract
A model learning unit determines a model parameter for calculating an estimated value for each of a plurality of training sets, each including a measurement signal and at least one type of predetermined characteristic value indicating characteristics of the measurement signal as a target value, to minimize a difference between the estimated value calculated for the measurement signal using a predetermined mathematical model and the target value is minimized, determines characteristic value sets, each being a set of a plurality of types of characteristic values indicating characteristics of the measurement signal including the target value, with which, for each target value, the target value is common to a plurality of characteristic value sets, and generates, for each of the characteristic value sets, each of the plurality of training sets including the target value and a measurement signal having characteristics indicated by the plurality of types of characteristic values.