The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jun. 09, 2023
Dell Products L.p., Round Rock, TX (US);
Norbert Adear, Beer Sheva, IL;
Abhishek Sharma, Berlin, DE;
Prateek Srivastava, Cedar Park, TX (US);
Luis Arturo Perez, Austin, TX (US);
Rajesh Kumar, Bangalore, IN;
Eoin Fitzgerald, Galway, IE;
Anvesh Kalia, Round Rock, TX (US);
Devisha Gupta, Kanpur, IN;
Karol Bocko, Bratislava, SK;
John Denton, Paige, TX (US);
Rosalind Granado, Austin, TX (US);
Manjunatha B, Bangalore, IN;
Dell Products, L.P., Round Rock, TX (US);
Abstract
Methods, apparatus, and processor-readable storage media for automatically detecting data anomalies using artificial intelligence techniques are provided herein. An example computer-implemented method includes obtaining data pertaining to multiple tasks associated with at least one enterprise; detecting one or more data anomalies by predicting one or more values within the obtained data by processing at least a portion of the obtained data using one or more artificial intelligence techniques, and comparing the one or more predicted values to one or more corresponding portions of the obtained data; generating one or more data recommendations associated with at least a portion of the one or more detected data anomalies; and performing one or more automated actions based at least in part on at least one of the one or more detected data anomalies and the one or more generated data recommendations.