The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Mar. 25, 2024
Oracle International Corporation, Redwood Shores, CA (US);
Edward R. Wetherbee, Omaha, NE (US);
Kenneth P. Baclawski, Waltham, MA (US);
Guang C. Wang, San Diego, CA (US);
Kenny C. Gross, Escondido, CA (US);
Anna Morav, East Palo Alto, CA (US);
Dieter Gawlick, Palo Alto, CA (US);
Zhen Hua Liu, San Mateo, CA (US);
Richard Paul Sonderegger, Dorchester, MA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Systems, methods, and other embodiments associated with auditing the results of a machine learning model are described. In one embodiment, a method accesses original time series data and machine learning estimates of the original time series data. The method generates reconstituted time series data from the machine learning estimates by reversing operations of a machine learning model trained for generating the machine learning estimates from the original time series data. The method detects tampering (or corruption) in the original time series data based on a difference between the original time series data and reconstituted time series data. And, the method generates an electronic verification report that indicates whether the tampering (or corruption) is detected in the original time series data.