The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Oct. 28, 2021
Checkpoint Systems, Inc., Thorofare, NJ (US);
Thomas Craig Weakley, Simpsonville, SC (US);
CHECKPOINT SYSTEMS, INC., Thorofare, NJ (US);
Abstract
This disclosure relates to inline testing of RFID inlays. A test system includes a test interface without moving parts and a marking device. The test interface an array of antennas, a radio frequency identification (RFID) reader to interrogate RFID inlays to be tested; and a circuit configured to selectively connect the RFID reader to the antenna in the array of antenna. The test interface performs a primary scan of all of the RFID inlays to be tested and, when not all of the RFID inlays respond, a secondary scan to determine which of the RFID inlays failed to respond. The marking devices mark any of the identified RFID inlays that failed to respond.