The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Mar. 10, 2023
Applicant:

Ivanti, Inc., South Jordan, UT (US);

Inventors:

Paul Keith Branton, Rochdale, GB;

Jens Miltner, Neunkirchen am Brand, DE;

Assignee:

Ivanti, Inc., South Jordan, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2457 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24573 (2019.01);
Abstract

A method of profiling an endpoint includes generating a structured request including a set of inquiries, each of which being directed to an endpoint parameter and including a parameter name. The method includes generating a scan message including the set of inquiries and an additional inquiry directed to an additional endpoint parameter. The method includes receiving a single response from the endpoint including raw parameter data responsive to the set of inquiries and the additional inquiry. The method includes storing the raw parameter data in a data lake organized according to extracted metadata. The method includes labeling each data portion using the parameter name and the extracted metadata. The method may include accessing, from the data lake, portions of the raw parameter data responsive to the set of inquiries based on labels associated therewith. The method includes generating a profile report derived from the accessed data.


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