The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Dec. 08, 2023
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Stephanie Margaret Pirman, Chicago, IL (US);

Jeffrey Wayne Texada, Carrollton, TX (US);

Eric Joseph DePree, Evanston, IL (US);

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0757 (2013.01); G06F 11/0709 (2013.01); G06F 11/0727 (2013.01);
Abstract

A method analyzes dependency information for a first data store. Upon determining that a data pipeline associates a first log type generated by the first data store with a second log type generated by a second data store, a first number of logs of the first log type that are generated at a first time, a first baseline number, and a first threshold value are determined. Upon determining that the first number of logs differs from the first baseline number by less than the first threshold value, a second number of logs of the second log type that are generated at a second time, a second baseline number, and a second threshold value are determined. Upon determining that the second number of logs differs from the second baseline number by more than the second threshold value, the data pipeline is identified as degraded.


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