The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Jul. 08, 2021
Applicant:

Cirrus Logic International Semiconductor Ltd., Edinburgh, GB;

Inventors:

Gregory C. Yancey, Austin, TX (US);

Michael Kost, Cedar Park, TX (US);

Tejasvi Das, Austin, TX (US);

Siddharth Maru, Austin, TX (US);

Matthew Beardsworth, Austin, TX (US);

Vadim Konradi, Austin, TX (US);

Assignee:

Cirrus Logic Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); G01R 27/02 (2006.01); G01R 27/26 (2006.01); G06F 1/16 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0412 (2013.01); G01R 27/025 (2013.01); G01R 27/2605 (2013.01); G06F 1/1613 (2013.01); G01R 27/2611 (2013.01);
Abstract

A system may include a resistive-inductive-capacitive sensor, a driver configured to drive the resistive-inductive-capacitive sensor at a driving frequency, a measurement circuit communicatively coupled to the resistive-inductive-capacitive sensor and configured to measure phase information and amplitude associated with the resistive-inductive-capacitive sensor, and a noise detection circuit communicatively coupled to the measurement circuit and configured to determine a presence of external interference in the system based on at least one of the phase information and the amplitude information.


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