The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Nov. 24, 2021
Applicant:

Lawrence Livermore National Security, Llc, Livermore, CA (US);

Inventor:

Frank Ravizza, Brentwood, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/16 (2006.01); G03H 1/04 (2006.01); G03H 1/08 (2006.01);
U.S. Cl.
CPC ...
G03H 1/16 (2013.01); G03H 1/0443 (2013.01); G03H 1/0808 (2013.01); G03H 2001/045 (2013.01); G03H 2223/23 (2013.01); G03H 2223/55 (2013.01);
Abstract

Differential Holography technology measures the amplitude and/or phase of, e.g., an incident linearly polarized spatially coherent quasi-monochromatic optical field by optically computing the first derivative of the field and linearly mapping it to an irradiance signal detectable by an image sensor. This information recorded on the image sensor is then recovered by a simple algorithm. In some embodiments, an input field is split into two or more beams to independently compute the horizontal and vertical derivatives (using amplitude gradient filters in orthogonal orientations) for detection on one image sensor in separate regions of interest (ROIs) or on multiple image sensors. A third unfiltered beam recorded in a third ROI directly measures amplitude variations in the input field to numerically remove its contribution as noise before recovering the original wavefront using a numerical in algorithm. When combined, the measured amplitude and phase constitute a holographic recording of the incident optical field.


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