The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Nov. 30, 2021
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Oliver Keul, Wetzlar, DE;

Volker Schacht, Wetzlar, DE;

Kai Ritschel, Wetzlar, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/24 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/242 (2013.01); G02B 21/26 (2013.01);
Abstract

A control device for a microscope includes an actuator configured to shift a microscopic field of view relative to a sample, and an operating device configured to be operated by a user to control the actuator in accordance with a response characteristic determining a shift sensitivity. The field of view is shifted relative to the sample in response to a user operation of the operating device. The control device further includes a processor configured to determine a total visual magnification, and to control the response characteristic of the operating device based on the total visual magnification. The field of view is visualized by the microscope to the user based on the total visual magnification.


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