The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Sep. 23, 2020
Applicant:

Palitronica Inc., Waterloo, CA;

Inventors:

Carlos Moreno, Waterloo, CA;

Sebastian Fischmeister, Waterloo, CA;

Philippe Vibien, Waterloo, CA;

Assignee:

Palitronica Inc., Waterloo, CA;

Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G01R 31/302 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31719 (2013.01); G01R 31/3025 (2013.01); G01R 31/31713 (2013.01); G01R 31/31907 (2013.01);
Abstract

Methods, systems and techniques are provided to authenticate a device under test (DUT)/system under test (SUT) comprising an electronic component(s). A profile is defined by injecting a signal to elicit an output that is responsive a physical characteristic of the type of DUT/SUT. In respective embodiments the injected signal is defined to elicit an output for time-domain or frequency-domain evaluation. An injected signal may comprise combinations of (non-destructive/non-activating) signals applied to multiple access points for measurement at arbitrary access points of the DUT/SUT. In an embodiment, measurements of multiple DUT/SUTs of a same type are used to define a common profile. In an embodiment, the profile is built using machine learning to define a classifier. In other embodiments, statistical profiles are defined. During use, output is generated for a target DUT/SUT for evaluation relative to the profile. Counterfeit/alternate designs, altered designs, and implants are detectable.


Find Patent Forward Citations

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Moreno, Carlos. (2025). Method and apparatus for detection of counterfeit parts, compromised or tampered components or devices, tampered systems such as local communication networks, and for secure identification of components (U.S. Patent No. 12366604). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12366604

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