The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Feb. 24, 2023
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventor:

Hyun Seung Kim, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/10 (2006.01); G01R 31/26 (2020.01); H01L 21/66 (2006.01); H01L 23/00 (2006.01); H01L 23/48 (2006.01); H01L 23/528 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2836 (2013.01);
Abstract

A semiconductor device includes a first crack detection circuit configured to receive a first external detection signal and output the first external detection signal as a first internal detection signal through a first metal line or configured to receive the first internal detection signal through the first metal line and output the first internal detection signal as the first external detection signal, and a second crack detection circuit configured to receive the first internal detection signal and output the first internal detection signal as a second internal detection signal through a second metal line or configured to receive the second internal detection signal through the second metal line and output the second internal detection signal as the first internal detection signal.


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