The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Jul. 14, 2022
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventors:

Felipe Wilches Bernal, Thornton, CO (US);

Matthew J. Reno, Albuquerque, NM (US);

Javier Hernandez Alvidrez, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2020.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G01R 31/088 (2013.01); G01R 31/086 (2013.01); G06F 17/16 (2013.01);
Abstract

Systems and methods for new systems and methods for detecting power quality disturbances, such as faults. The approach is based on the dynamic mode decomposition (DMD)—a data-driven method to estimate linear dynamics whose eigenvalues and eigenvectors approximate those of the Koopman operator. The approach uses the real part of the main eigenvalue estimated by the DMD as the key indicator that a power quality event has occurred. The disclosed systems and methods can be used to detect events using current and voltage signals to distinguish different faults. Because the proposed method is window-based, the effect that the window size has on the performance of the approach is analyzed.


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