The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Sep. 15, 2022
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Salma Benslimane, Menlo Park, CA (US);

Ana Escobar, Bagneux, FR;

Remi Robutel, Versailles, FR;

Laurent Laval, Verrieres le Buisson, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 15/18 (2013.01); G01F 15/18 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01F 15/18 (2013.01); G06N 20/00 (2019.01);
Abstract

A method, sensor, and non-transitory computer-readable storage medium are provided for estimating actual amplitudes of a waveform. A machine learning model may be trained for an embedded system of a first three-axes sensor having a limited range to estimate the actual amplitudes of a waveform that saturates the first three-axes sensor in a direction of one of the three axes. The embedded system acquires a second waveform during use of a tool including the first three-axes sensor. The second waveform that occurs after a second waveform producing event is isolated. The embedded system extracts a multi-dimensional feature from the isolated second waveform and estimates, using the machine learning model, the actual amplitudes of the second waveform based on the extracted multi-dimensional feature.


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