The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jul. 09, 2020
Applicant:
Kanadevia Corporation, Osaka, JP;
Inventors:
Kaoru Shinoda, Osaka, JP;
Masamitsu Abe, Osaka, JP;
Joichi Murakami, Osaka, JP;
Hiroshi Hattori, Osaka, JP;
Assignee:
KANADEVIA CORPORATION, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01N 29/04 (2006.01); G01N 29/06 (2006.01); G01N 29/24 (2006.01); G01N 29/26 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01N 29/043 (2013.01); G01N 29/069 (2013.01); G01N 29/2437 (2013.01); G01N 29/262 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/044 (2013.01); G01N 2291/106 (2013.01); G01N 2291/267 (2013.01);
Abstract
In an ultrasonic testing method and an ultrasonic testing device that ultrasonically examine a flaw of a subject, a scanning range specified for the subject is scanned while flaw testing is performed by an array probe, and it is determined that a flaw is present at a point where a groove signal DG is present and a bottom echo signal BE is not obtained.