The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Sep. 25, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yunho Kim, Yongin-si, KR;

Jinhyeok Jang, Suwon-si, KR;

Hyunwoo Kim, Yongin-si, KR;

Jaeeun Song, Hwaseong-si, KR;

Seokjun Won, Seoul, KR;

Yigil Cho, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/49 (2006.01); B01D 35/06 (2006.01); G01N 27/30 (2006.01); G01N 27/416 (2006.01); C25B 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/301 (2013.01); B01D 35/06 (2013.01); G01N 27/4161 (2013.01); G01N 27/49 (2013.01); C25B 15/00 (2013.01);
Abstract

A filter contamination measuring device includes: a working electrode adjacent to a first surface of a filter, the filter configured to adsorb an ionic material of a first polarity, a counter electrode disposed on the other surface of the filter, a potentiostat configured to apply a voltage of a second polarity to the working electrode for a predetermined period of time, and to measure current output from the working electrode. The potentiostat is configured to increase the voltage over the predetermined amount of time. The filter contamination measuring device further includes a controller configured to calculate a maximum current attained during the predetermined amount of time and a corresponding voltage value, and to determine the type and concentration of the ionic material based on the maximum current and the voltage value.


Find Patent Forward Citations

Loading…