The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Dec. 10, 2022
Hyundai Motor Company, Seoul, KR;
Kia Corporation, Seoul, KR;
Korea Institute of Science and Technology, Seoul, KR;
Yun Sung Kim, Gyeonggi-do, KR;
Yoon Kwang Lee, Gyeonggi-do, KR;
Ga Hyeon Im, Gyeonggi-do, KR;
Sang Heon Lee, Gyeonggi-do, KR;
Kyu Joon Lee, Seoul, KR;
Jae Pyoung Ahn, Seoul, KR;
Hae Ryoung Kim, Seoul, KR;
Hyun Woo Gong, Seoul, KR;
Byeong Hyeon Lee, Seoul, KR;
Hyundai Motor Company, Seoul, KR;
Kia Corporation, Seoul, KR;
Korea Institute of Science and Technology, Seoul, KR;
Abstract
Disclosed are a sample holder for X-ray diffraction analysis and an X-ray diffraction analysis method using the same. The sample holder for X-ray diffraction analysis includes a housing part formed of a side wall and a bottom plate with an open upper portion thereof, the housing part including an inner space partitioned from the side wall and the bottom plate, a cover part configured to cover the upper portion of the housing part and to allow X-rays to pass therethrough, and a support part installed to be movable upwards and downwards in the inner space, the support part including a plate-shaped substrate having a predetermined area, the substrate having a sample placed thereon.