The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Nov. 21, 2022
Beijing University of Technology, Beijing, CN;
Beijing University of Technology, Beijing, CN;
Abstract
The present disclosure provides a device and method for measuring a correlation between fatigue performance and a microstructure of a one-dimensional (1D) nanomaterial in situ in a transmission electron microscope (TEM), belongs to the technical field of in-situ testing and characterization of microstructures of nanomaterials. The device includes a chip part, a supporting part, and a control circuit. The supporting part is a bracket and a cable disposed on a transmission sample holder, and the circuit part consists of cables connected to the chip and a power supply capable of applying different waveforms, variable voltages, and variable frequencies. This design breaks through a traditional mechanical stress-driven fatigue performance test method, and achieves controllable adjustment of different amplitudes and cycles by using an electric field formed by a voltage and adjusting a voltage size and frequency, such that the 1D nanomaterial vibrates in the electric field to achieve fatigue performance testing.