The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jun. 29, 2023
Hach Company, Loveland, CO (US);
Russell Paul Gorham, Windsor, CO (US);
Nelson E. Dervaes, Fort Collins, CO (US);
HACH COMPANY, Loveland, CO (US);
Abstract
An embodiment provides a method for measuring an analyte of a sample using a colorimeter, including: introducing the sample into a measurement chamber of the colorimeter, wherein the measurement chamber comprises an optical path from a light source to an optical sensor; identifying and waiting a sample settling period, wherein the sample settling period comprises a dynamic length of time, wherein the identifying comprises: measuring, using the optical sensor, a light throughput of the sample; and determining, based upon the measuring, the light throughput has reached a stable baseline; and obtaining a reference measurement of the sample when the stable baseline is reached. Other aspects are described and claimed.