The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Feb. 01, 2021
Applicant:

The General Hospital Corporation, Boston, MA (US);

Inventors:

Seemantini Nadkarni, Boston, MA (US);

Zeinab Hajjarian-Kashany, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/0205 (2024.01); G01N 15/01 (2024.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 15/01 (2024.01); G01N 2015/0222 (2013.01);
Abstract

A method for non-destructively estimating an average size of scattering particles in a sample, including: transmitting, using a coherent light source, polarized light to the sample; obtaining, using a detector, polarized light reflected from the sample, the polarized light comprising a parallel polarized component and a perpendicular polarized component; determining, using a processor, speckle decorrelation rates for the parallel polarized component and the perpendicular polarized component; and estimating, using the processor, the average size of scattering particles in the sample based on the speckle decorrelation rates for the parallel polarized component and the perpendicular polarized component.


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