The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jun. 15, 2021
Safran, Paris, FR;
Rafik Hadjria, Moissy-Cramayel, FR;
Oscar D'Almeida, Moissy-Cramayel, FR;
Minh Chau Phan Huy, Moissy-Cramayel, FR;
Nassim Salhi, Moissy-Cramayel, FR;
SAFRAN, Paris, FR;
Abstract
A method for measuring temperature and deformation of a part or structure on the basis of a single line of optical fiber having a single Bragg rating is provided. The method includes: interrogating the optical fiber based on two sampling frequencies; one being a low frequency and the other being a high frequency, said low frequency being suitable for sensing a slow rate of change corresponding to the temperature variation, and said high frequency being suitable for sensing a fast rate of change corresponding to vibrations; implementing an algorithmic block based on a blind-source-separation (BSS) technique, comprising a frequency analysis, a multivariate analysis and higher-order statistics; and returning to the time domain via an inverse Fourier transform.
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