The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Aug. 05, 2019
Applicant:

The University of Tokyo, Tokyo, JP;

Inventors:

Yohei Kobayashi, Tokyo, JP;

Shuntaro Tani, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/36 (2014.01); B23K 26/062 (2014.01); G01B 11/24 (2006.01); G05B 13/02 (2006.01); G05B 13/04 (2006.01); G05B 19/4099 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
B23K 26/36 (2013.01); B23K 26/062 (2015.10); G01B 11/24 (2013.01); G05B 13/027 (2013.01); G05B 13/042 (2013.01); G05B 19/4099 (2013.01); G06N 20/00 (2019.01); G05B 2219/45041 (2013.01);
Abstract

Deep learning is performed by using a material of a processing object, a laser beam parameter showing a property of laser beam which the processing object is irradiated with, and pre-processed part data and post-processed part data that respectively reflect laser processing-involved three-dimensional shapes of a processed part before and after irradiation of the processing object with the laser beam. A first relationship of input data that are the material of the processing object, the pre-processed part data, and the laser beam parameter to output data that is the post-processed part data after irradiation with the laser beam in relation to the input data is accordingly obtained as one learning result.


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