The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jan. 22, 2021
Satake Corporation, Tokyo, JP;
Tomoyuki Miyamoto, Tokyo, JP;
Takuya Nishida, Tokyo, JP;
Hideaki Ishizu, Tokyo, JP;
Masaaki Sadamaru, Tokyo, JP;
SATAKE CORPORATION, Tokyo, JP;
Abstract
An inspection unit for performing an optical inspection on a grain to be transferred by transfer means includes a visible light source, a near-infrared light source, a visible light detection unit, and a near-infrared light detection unit. A determination unit plots wavelength components of red (R), green (G), and blue (B), and a near-infrared light component in a three-dimensional space, to create a three-dimensional optical correlation diagram, for a plurality of good product samples and defective product samples, and sets a threshold value, in which: the wavelength components are detected by the visible light detection unit; and the near-infrared light component is detected by the near-infrared light detection unit.