The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Jan. 02, 2019
Eva-maria S. Collins, Wallingford, PA (US);
Danielle Ireland, Highlands Ranch, CO (US);
Siqi Zhang, San Diego, CA (US);
Eva-Maria S. Collins, Wallingford, PA (US);
Danielle Ireland, Highlands Ranch, CO (US);
Siqi Zhang, San Diego, CA (US);
INVERITEK, LLC, Wallingford, PA (US);
Abstract
A high throughput system and method for analyzing the effects of a plurality of agents on planaria is disclosed. Multiple test zones are provided, where each test zone contains at least a portion of one planarian. The planaria in each test zone are then exposed to at least one agent, the test zones are sealed, and at various times, the test zones are moved automatically between a storage location and at least one assay station. At each assay station, the test zones are exposed to a set of conditions, and an image or video of the planaria in the test zones are captured. Automated image or video analysis is used to are evaluate and determine whether the agent has an effect.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile