The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
May. 09, 2022
Applicant:
Eyeque Inc., Newark, CA (US);
Inventors:
Noam Sapiens, Newark, CA (US);
John Serri, Newark, CA (US);
Assignee:
EyeQue INC., Newark, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/103 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); A61B 3/0008 (2013.01); A61B 3/14 (2013.01); G06T 7/0014 (2013.01); G06T 2207/30041 (2013.01);
Abstract
Disclosed embodiments include means and methods of automatically measuring numerous characteristics of an optical system, such as an eye. Measured or displayed optical properties may include but are not limited to. spherical power, cylinder and axis for astigmatism. Higher order optical aberrations may also be measured. Disclosed embodiments may be used to measure refraction for creating corrective lenses for eyeglasses and contact lenses. Measurements of higher order aberrations of an eye may be used for measuring enhanced correction, accommodation state and range.