The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

May. 20, 2022
Applicant:

Fortanix, Inc., Mountain View, CA (US);

Inventors:

Xinyu Lin, San Jose, CA (US);

Jethro Gideon Beekman, Eindhoven, NL;

Jeffrey Seyfried, Cupertino, CA (US);

Assignee:

Fortanix, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/06 (2006.01);
U.S. Cl.
CPC ...
H04L 9/0618 (2013.01);
Abstract

A method includes receiving input data that includes a plurality of input parts, wherein the input data corresponds to a data schema, wherein the data schema includes a plurality of schema parts, wherein each schema part specifies a set of one or more possible values, and wherein each input part satisfies a respective schema part. The method further includes generating an intermediate numeric value that represents the input data, generating, using a format-preserving encryption algorithm, an encrypted numeric value based on the intermediate numeric value, determining a number of possible values that satisfy the data schema, determining whether the encrypted numeric value satisfies a threshold criterion based on the number of possible values that satisfy the data schema, and responsive to determining that the encrypted numeric value satisfies the threshold criterion, generating, based on the encrypted numeric value, output data that conforms to the data schema.


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