The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Apr. 14, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seungkeun Yoon, Suwon-si, KR;

Seijoon Kim, Suwon-si, KR;

Hyunsoo Kim, Suwon-si, KR;

Chang-Woo Shin, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); G06F 7/544 (2006.01); G06N 3/04 (2023.01); G06N 3/063 (2023.01); G06N 3/065 (2023.01); G06N 3/08 (2023.01); H03M 1/12 (2006.01); H03M 1/46 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0648 (2013.01); G06F 7/5443 (2013.01); G06N 3/04 (2013.01); G06N 3/063 (2013.01); G06N 3/065 (2023.01); G06N 3/08 (2013.01); H03M 1/125 (2013.01); H03M 1/462 (2013.01);
Abstract

A method of optimizing a quantization step size of an analog-to-digital converter (ADC) based on a number of crossbar arrays of a computing device includes: generating a first mapping relationship between the quantization step size of the ADC and a first root mean square error, the first root mean square error reflecting a quantization error and a clipping error, wherein the generating the first graph is based on use of only a single crossbar array; generating a second mapping relationship between the quantization step size of the ADC and a second root mean square error, the second root mean square error reflecting a quantization error, wherein the generating the second mapping is based on a uniform distribution of a total sum of quantization errors; and determining the quantization step size of the ADC based on the first mapping relationship and the second mapping relationship.


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Yoon, Seungkeun. (2025). Determining quantization step size for crossbar arrays (U.S. Patent No. 12362757). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12362757

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