The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Jun. 24, 2022
Applicant:

Rapiscan Systems, Inc., Torrance, CA (US);

Inventors:

Mark Procter, Wilmslow, GB;

James Ollier, Huyton, GB;

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/11 (2017.01); G06V 10/50 (2022.01);
U.S. Cl.
CPC ...
G06V 10/507 (2022.01); G06T 7/11 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/20216 (2013.01);
Abstract

The present specification relates to a method for enabling an operator to perform visual layer separation, the method including: retrieving at least one X-ray scan image from a memory in data communication with an inspection system, wherein the image comprises a first area of pixels representative of a target object obscured by a clutter object and a second area of pixels representative of the clutter object; receiving a selection of the pixels representative of the first area; receiving a selection of the pixels representative of the second area; determining if the selected second area meets a predefined quality threshold; if the selected second area meets the predefined quality threshold, generating a modified at least one X-ray image; and if the selected second area does not meet the predefined quality threshold, prompting the operator to select a different second area of pixels representative of the clutter object.


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