The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Apr. 10, 2020
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Yonatan Winetraub, Mountain View, CA (US);

Edwin Yuan, Stanford, CA (US);

Itamar Terem, Menlo Park, CA (US);

Caroline Yu, Castro Valley, CA (US);

Adam De La Zerda, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01N 21/64 (2006.01); G06F 18/214 (2023.01); G06T 7/33 (2017.01); G06T 19/20 (2011.01); G06V 10/75 (2022.01); G06V 20/64 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06T 19/20 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G06F 18/214 (2023.01); G06T 7/337 (2017.01); G06V 10/757 (2022.01); G06V 20/64 (2022.01); G06V 20/647 (2022.01); G06V 20/69 (2022.01); G01N 2021/6439 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30004 (2013.01);
Abstract

Alignment of a 2D image to a corresponding 3D image is provided by writing a pattern into a 3D sample. The pattern is at known positions in the 3D image, and provides visible reference features in the 2D image. This permits accurate determination of the plane in the 3D image that corresponds to the 2D image.


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