The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Apr. 05, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Yingen Xiong, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 7/50 (2017.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06T 17/205 (2013.01); G06T 7/50 (2017.01); G06T 19/006 (2013.01);
Abstract

A method includes obtaining images of an environment captured by imaging sensors associated with a passthrough AR device and position data and depth data associated with the images. The method also includes generating a point cloud representative of the environment based on the images, position data, and depth data. The method further includes generating a mesh for a specified image. The mesh includes grid points at intersections of mesh lines. The method also includes determining one or more depths of one or more grid points of the mesh. The method further includes transforming the mesh from a viewpoint of a specified imaging sensor that captured the specified image to a user viewpoint of the passthrough AR device based on the depth(s) of the grid point(s). In addition, the method includes rendering a virtual view of the specified image for presentation by the passthrough AR device based on the transformed mesh.


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