The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Jan. 05, 2021
Fanuc Corporation, Yamanashi, JP;
Shoutarou Ogura, Yamanashi, JP;
Fumikazu Warashina, Yamanashi, JP;
Fanuc Corporation, Yamanashi, JP;
Abstract
A model pattern evaluation device for a robotic system comprises a processor. The processor is configured to: receive an image in which a target object is represented captured by a camera attached to a movable robotic component of the robotic system; calculate, for detecting the target object from the image, an evaluation value representing a geometric distribution of a plurality of features in a model pattern, the model pattern corresponding to the target object; set, among the plurality of features, a first feature for detecting a position in a specific direction of the target object in the image or a second feature for detecting an angle in a rotational direction centered about a predetermined point of the target object in the image as a feature of interest based on the evaluation value; and generate a detection result based on the first or second features to control the movable robotic component.