The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Feb. 17, 2023
Applicant:

Ventana Medical Systems, Inc., Tucson, AZ (US);

Inventors:

Auranuch Lorsakul, Santa Clara, CA (US);

Zuo Zhao, Mountain View, CA (US);

Yao Nie, Sunnyvale, CA (US);

Xingwei Wang, Sunnyvale, CA (US);

Kien Nguyen, Seattle, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 2207/20084 (2013.01);
Abstract

The present disclosure relates to techniques for transforming digital pathology images obtained by different slide scanners into a common format for image analysis. Particularly, aspects of the present disclosure are directed to obtaining a source image of a biological specimen, the source image is generated from a first type of scanner, inputting into a generator model a randomly generated noise vector and a latent feature vector from the source image as input data, generating, by the generator model, a new image based on the input data, inputting into a discriminator model the new image, generating, by the discriminator model, a probability for the new image being authentic or fake, determining whether the new image is authentic or fake based on the generated probability, and outputting the new image when the image is authentic.


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