The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Aug. 27, 2020
Applicant:
Hitachi High-tech Corporation, Tokyo, JP;
Inventors:
Assignee:
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 5/00 (2006.01); A61B 5/11 (2006.01); G06T 7/50 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 5/0077 (2013.01); A61B 5/1114 (2013.01); A61B 5/1128 (2013.01); A61B 5/7203 (2013.01); G06T 7/50 (2017.01); G06T 7/73 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30008 (2013.01);
Abstract
Provided is a measurement apparatus including a processor and a storage unit. The storage unit holds measurement data of each time point which is obtained by a photographing apparatus, and temporal-spatial constraints. The processor extracts a position of an object from the measurement data of each time point, determines whether the object satisfies the temporal-spatial constraints, and determines, based on a result of the determination on whether the object satisfies the temporal-spatial constraints, whether the object is an analysis target.