The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Aug. 23, 2022
Plaid Inc., San Francisco, CA (US);
Vivian Li, San Jose, CA (US);
Nikki Dahan, San Mateo, CA (US);
Julie Shin, San Francisco, CA (US);
Vikram Rao, San Francisco, CA (US);
Akshit Annadi, San Francisco, CA (US);
Christine Zhou, Seattle, WA (US);
Zeng Wang, Palo Alto, CA (US);
Stella Kim, San Francisco, CA (US);
Chris Jin, Atlanta, GA (US);
Darius Simmons, Atlanta, GA (US);
Plaid Inc., San Francisco, CA (US);
Abstract
In some implementations, a classification system may receive credentials associated with a data source and may receive, from the data source and using the credentials, a set of structured data including input events and output events. The classification system may filter the set of structured data by applying a first set of rules to generate a filtered set of structured data and may convert the filtered set of structured data to one or more numerical vectors, where a vector space associated with the one or more numerical vectors is infinite-dimensional. The classification system may further cluster the one or more numerical vectors using a first machine learning model to generate one or more clusters. Accordingly, the classification system may determine one or more classifications based on the set of structured data, each of the one or more classifications being associated with a corresponding frequency and a corresponding category.